6  * We are not replicating memory tests for stuck bits and other
7  * hardware level failures but looking for issues with different size
51  * Helper macros for endian handling.
64  * Fill the data with ascending (for little-endian) or descending (for
76     for (i = 0; i < TEST_SIZE; i++) {  in init_test_data_u8()
86  * should mean for reads larger than a byte all subsequent reads will
102     for (i = 0; i < TEST_SIZE / 2; i++) {  in init_test_data_s8()
112  * Zero the first few bytes of the test data in preparation for
126     for (i = 0; i < offset; i++) {  in reset_start_data()
145     for (i = 0; i < max; i++) {  in init_test_data_u16()
165     for (i = 0; i < max; i++) {  in init_test_data_u32()
188     for (i = 0; i < max; i++) {  in init_test_data_u64()
211     for (i = 0; i < max; i++) {  in read_test_data_u16()
236     for (i = 0; i < max; i++) {  in read_test_data_u32()
278     for (i = 0; i < max; i++) {  in read_test_data_u64()
339     for (i = 0; i < ARRAY_SIZE(read_ufns) && ok; i++) {  in do_unsigned_reads()
342         for (off = start_off; off < 8 && ok; off++) {  in do_unsigned_reads()
358     for (i = 0; i < 8 && ok; i++) {  in do_unsigned_test()
382     for (i = 0; i < max; i++) {  in read_test_data_s8()
414      * Therefore the logic below must be flipped for big-endian.  in read_test_data_s16()
420     for (i = 0; i < max; i++) {  in read_test_data_s16()
447      * Therefore the logic below must be flipped for big-endian.  in read_test_data_s32()
453     for (i = 0; i < max; i++) {  in read_test_data_s32()
472  * For everything except bytes all our reads should be either positive
484     for (i = 0; i < ARRAY_SIZE(read_sfns) && ok; i++) {  in do_signed_reads()
487         for (off = 0; off < 8 && ok; off++) {  in do_signed_reads()
517     for (i = 0; i < ARRAY_SIZE(init_ufns) && ok; i++) {  in main()