thermal/qcom/qcom-spmi-adc-tm5.c

27  * channel is programmed to use one of ADC channels for voltage comparison.
169 	int (*disable_channel)(struct adc_tm5_channel *channel);
170 	int (*configure)(struct adc_tm5_channel *channel, int low, int high);
178  * struct adc_tm5_channel - ADC Thermal Monitoring channel data.
179  * @channel: channel number.
180  * @adc_channel: corresponding ADC channel number.
182  * @prescale: channel scaling performed on the input signal.
185  * @decimation: sampling rate supported for the channel.
188  * @high_thr_en: channel upper voltage threshold enable state.
189  * @low_thr_en: channel lower voltage threshold enable state.
191  * @iio: IIO channel instance used by this channel.
193  * @tzd: thermal zone device used by this channel.
196 	unsigned int		channel;
216  * @channels: array of ADC TM channel data.
218  * @decimation: sampling rate supported for the channel.
225  *      It is used to ensure only one ADC channel configuration
276 		unsigned int ch = chip->channels[i].channel;
284 			dev_err(chip->dev, "ctl read failed: %d, channel %d\n", ret, i);
337 		unsigned int ch = chip->channels[i].channel;
362 	struct adc_tm5_channel *channel = thermal_zone_device_priv(tz);
365 	if (!channel || !channel->iio)
368 	ret = iio_read_channel_processed(channel->iio, temp);
378 static int adc_tm5_disable_channel(struct adc_tm5_channel *channel)
380 	struct adc_tm5_chip *chip = channel->chip;
381 	unsigned int reg = ADC_TM5_M_EN(channel->channel);
444 static int adc_tm5_gen2_disable_channel(struct adc_tm5_channel *channel)
446 	struct adc_tm5_chip *chip = channel->chip;
452 	channel->meas_en = false;
453 	channel->high_thr_en = false;
454 	channel->low_thr_en = false;
463 	val |= FIELD_PREP(ADC_TM_GEN2_TM_CH_SEL, channel->channel);
467 		dev_err(chip->dev, "adc-tm channel disable failed with %d\n", ret);
479 	ret = adc_tm5_gen2_conv_req(channel->chip);
481 		dev_err(chip->dev, "adc-tm channel configure failed with %d\n", ret);
510 static int adc_tm5_configure(struct adc_tm5_channel *channel, int low, int high)
512 	struct adc_tm5_chip *chip = channel->chip;
514 	u16 reg = ADC_TM5_M_ADC_CH_SEL_CTL(channel->channel);
519 		dev_err(chip->dev, "channel %d params read failed: %d\n", channel->channel, ret);
523 	buf[0] = channel->adc_channel;
527 		u16 adc_code = qcom_adc_tm5_temp_volt_scale(channel->prescale,
538 		u16 adc_code = qcom_adc_tm5_temp_volt_scale(channel->prescale,
551 	buf[6] |= FIELD_PREP(ADC_TM5_M_CTL_HW_SETTLE_DELAY_MASK, channel->hw_settle_time);
553 	buf[6] |= FIELD_PREP(ADC_TM5_M_CTL_CAL_SEL_MASK, channel->cal_method);
559 		dev_err(chip->dev, "channel %d params write failed: %d\n", channel->channel, ret);
566 static int adc_tm5_gen2_configure(struct adc_tm5_channel *channel, int low, int high)
568 	struct adc_tm5_chip *chip = channel->chip;
575 	channel->meas_en = true;
583 	/* Set SID from virtual channel number */
584 	buf[0] = channel->adc_channel >> 8;
586 	/* Set TM channel number used and measurement interval */
588 	buf[1] |= FIELD_PREP(ADC_TM_GEN2_TM_CH_SEL, channel->channel);
593 	buf[2] |= FIELD_PREP(ADC_TM_GEN2_CTL_DEC_RATIO_MASK, channel->decimation);
595 	buf[2] |= FIELD_PREP(ADC_TM_GEN2_CTL_CAL_SEL, channel->cal_method);
597 	buf[3] = channel->avg_samples | ADC_TM_GEN2_FAST_AVG_EN;
599 	buf[4] = channel->adc_channel & 0xff;
601 	buf[5] = channel->hw_settle_time & ADC_TM_GEN2_HW_SETTLE_DELAY;
605 		channel->low_thr_en = true;
609 		channel->low_thr_en = false;
614 		channel->high_thr_en = true;
618 		channel->high_thr_en = false;
622 	if (channel->high_thr_en)
624 	if (channel->low_thr_en)
629 		dev_err(chip->dev, "channel %d params write failed: %d\n", channel->channel, ret);
633 	ret = adc_tm5_gen2_conv_req(channel->chip);
635 		dev_err(chip->dev, "adc-tm channel configure failed with %d\n", ret);
644 	struct adc_tm5_channel *channel = thermal_zone_device_priv(tz);
648 	if (!channel)
651 	chip = channel->chip;
653 		channel->channel, low, high);
656 		ret = chip->data->disable_channel(channel);
658 		ret = chip->data->configure(channel, low, high);
676 						    adc_tm->channels[i].channel,
681 				dev_dbg(adc_tm->dev, "thermal sensor on channel %d is not used\n",
682 					 adc_tm->channels[i].channel);
686 			dev_err(adc_tm->dev, "Error registering TZ zone for channel %d: %ld\n",
687 				adc_tm->channels[i].channel, PTR_ERR(tzd));
704 		if (chip->channels[i].channel >= ADC_TM5_NUM_CHANNELS) {
705 			dev_err(chip->dev, "Invalid channel %d\n", chip->channels[i].channel);
734 		if (chip->channels[i].channel >= channels_available) {
735 			dev_err(chip->dev, "Invalid channel %d\n", chip->channels[i].channel);
769 		if (chip->channels[i].channel >= channels_available) {
770 			dev_err(chip->dev, "Invalid channel %d\n", chip->channels[i].channel);
781 				       struct adc_tm5_channel *channel,
792 		dev_err(dev, "%s: invalid channel number %d\n", name, ret);
797 		dev_err(dev, "%s: channel number too big: %d\n", name, chan);
801 	channel->channel = chan;
805 	 * argument for channel number.  So don't bother parsing
806 	 * #io-channel-cells, just enforce cell_count = 1.
810 		dev_err(dev, "%s: error parsing ADC channel number %d: %d\n", name, chan, ret);
816 		dev_err(dev, "%s: invalid args count for ADC channel %d\n", name, chan);
825 		dev_err(dev, "%s: invalid ADC channel number %d\n", name, chan);
828 	channel->adc_channel = args.args[0];
830 	channel->iio = devm_fwnode_iio_channel_get_by_name(adc_tm->dev,
832 	if (IS_ERR(channel->iio))
833 		return dev_err_probe(dev, PTR_ERR(channel->iio), "%s: error getting channel\n",
844 		channel->prescale = ret;
847 		channel->prescale = 0;
858 		channel->hw_settle_time = ret;
860 		channel->hw_settle_time = VADC_DEF_HW_SETTLE_TIME;
864 		channel->cal_method = ADC_TM5_RATIOMETRIC_CAL;
866 		channel->cal_method = ADC_TM5_ABSOLUTE_CAL;
876 			channel->decimation = ret;
878 			channel->decimation = ADC5_DECIMATION_DEFAULT;
888 			channel->avg_samples = ret;
890 			channel->avg_samples = VADC_DEF_AVG_SAMPLES;