intel/ifs/ifs.h

1 /* SPDX-License-Identifier: GPL-2.0-only */
8  * DOC: In-Field Scan
11  * In-Field Scan
15  * ------------
17  * In Field Scan (IFS) is a hardware feature to run circuit level tests on
20  * with a new platform-device instance-id.
24  * ---------
26  * Intel provides a firmware file containing the scan tests via
28  * family-model-stepping. IFS Images are not applicable for some test types.
34  * -----------------
44  * ff-mm-ss-01.scan
45  * ff-mm-ss-02.scan
46  * ff-mm-ss-03.scan
51  * To load ff-mm-ss-02.scan, the following command can be used::
58  * -------------
112  * +------+--------------------+
114  * +------+--------------------+
116  * +------+--------------------+
119  * ---------------------
218 		u32	delay	:31;  member
257  * Driver populated error-codes
259  * 0xFE: not all scan chunks were executed. Maximum forward progress retries exceeded.
270  * struct ifs_data - attributes related to intel IFS driver
276  * @scan_details: opaque scan status code from h/w
311 	return &d->rw_data;  in ifs_get_data()
319 	return d->test_caps;  in ifs_get_test_caps()